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Ferroelastic domain switching significantly affects piezoelectric properties in ferroelectric materials. The ferroelastic domain switching and the lattice deformation of both  a -domains and  c -domains under an applied electric field were investigated using  in-situ  synchrotron X-ray diffraction in conjunction with a high-speed pulse generator set up for epitaxial (100)/(001)-oriented tetragonal Pb(Zr 0.4 Ti 0.6 )O 3  (PZT) films grown on (100)  c  SrRuO 3 //(100)KTaO 3  substrates. The  004  peak ( c -domain) position shifts to a lower 2 θ  angle, which demonstrates the elongation of the  c -axis lattice parameter of the  c -domain under an applied electric field. In contrast, the  400  peak ( a -domain) shifts in the opposite direction (higher angle), thus indicating a decrease in the  a -axis lattice parameter of the  a -domain. 90° domain switching from (100) to (001) orientations (from  a -domain to  c -domain) was observed by a change in the intensities of the  400  and  004  diffraction peaks by applying a high-speed pulsed electric field 200 ns in width. This change also accompanied a tilt in the angles of each domain from the substrate surface normal direction. This behaviour proved that the 90° domain switched within 40 ns under a high-speed pulsed electric field. Direct observation of such high-speed switching opens the way to design piezo-MEMS devices for high-frequency operation.

scientific reports

In-situ observation of ultrafast 90° domain switching under application of an electric field in (100)/(001)-oriented tetragonal epitaxial Pb(Zr0.4Ti0.6)O3 thin films