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The properties of artificially grown thin films are strongly affected bysurface processes during growth. Coherent X-rays provide an approach to betterunderstand such processes and fluctuations far from equilibrium. Here we reportresults for vacuum deposition of C$_{60}$ on a graphene-coated surfaceinvestigated with X-ray Photon Correlation Spectroscopy in surface-sensitiveconditions. Step-flow is observed through measurement of the step-edge velocityin the late stages of growth after crystalline mounds have formed. We show thatthe step-edge velocity is coupled to the terrace length, and that there is avariation in the velocity from larger step spacing at the center of crystallinemounds to closely-spaced, more slowly propagating steps at their edges. Theresults extend theories of surface growth, since the behavior is consistentwith surface evolution driven by processes that include surface diffusion, themotion of step-edges, and attachment at step edges with significant step-edgebarriers.

Coherent X-ray measurement of step-flow propagation during growth on polycrystalline thin film surfaces