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Plasmonic nanostructures and devices are rapidly transforming lightmanipulation technology by allowing to modify and enhance optical fields onsub-wavelength scales. Advances in this field rely heavily on the developmentof new characterization methods for the fundamental nanoscale interactions.However, the direct and quantitative mapping of transient electric and magneticfields characterizing the plasmonic coupling has been proven elusive to date.Here we demonstrate how to directly measure the inelastic momentum transfer ofsurface plasmon modes via the energy-loss filtered deflection of a focusedelectron beam in a transmission electron microscope. By scanning the beam overthe sample we obtain a spatially and spectrally resolved deflection map and wefurther show how this deflection is related quantitatively to the spectralcomponent of the induced electric and magnetic fields pertaining to the mode.In some regards this technique is an extension to the established differentialphase contrast into the dynamic regime.

Spectral field mapping in plasmonic nanostructures with nanometer resolution