English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

We present a new approach to tuning fork-based atomic force microscopy forutilizing advanced "tip-on-chip" probes with high sensitivity and broadcompatibility. Usually, such chip-like probes with a size reaching 2 mm x 2 mmdrastically perturb the oscillation of the tuning fork, resulting in poorperformance in its intrinsic force sensing. Therefore, restoring initialoscillatory characteristics is necessary for regaining high sensitivity. Tothis end, we developed a new approach consisting of three basic steps: tuningfork rebalancing, revamping holder-sensor fixation, and electrodereconfiguration. Mass rebalancing allows the tuning fork to recover thefrequency and regain high Q-factor values up to 10E4 in air and up to 4 x 10E4in ultra-high vacuum conditions. The floating-like holder-fixation using softwires significantly reduces energy dissipation from the mounting elements.Combined with the soft wires, reconfigured electrodes provide electrical accessto the chip-like probe without intervening in the force-sensing signal.Finally, our easy-to-implement approach allows converting the atomic forcemicroscopy-tip from a passive tool to a dedicated microdevice with extendedfunctionality.

Enhancing sensitivity in atomic force microscopy for planar tip-on-chip probes