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Highly confined vectorial electromagnetic field distributions represent anexcellent tool for detailed studies in nano-optics and high resolutionmicroscopy, such as nonlinear microscopy, advanced fluorescence imaging ornanoplasmonics. Such field distributions can be generated, for instance, bytight focussing of polarized light beams. To guarantee high quality andresolution in the investigation of objects with sub-wavelength dimensions, theprecise knowledge of the spatial distribution of the exciting vectorial fieldis of utmost importance. Full-field reconstruction methods presented so farinvolved, for instance, complex near-field techniques. Here, we demonstrate asimple and straight-forward to implement measurement scheme and reconstructionalgorithm based on the scattering signal of a single spherical nanoparticle asa field-probe. We are able to reconstruct the amplitudes of the individualfocal field components as well as their relative phase distributions withsub-wavelength resolution from a single scan measurement without the need forpolarization analysis of the scattered light. This scheme can help to improvemodern microscopy and nanoscopy techniques.

Nanointerferometric Amplitude and Phase Reconstruction of Tightly Focused Vector Beams