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Deviations from the perfect atomic arrangements in crystals play an importantrole in affecting their properties. Similarly, diffusion of such deviations isbehind many microstructural changes in solids. However, observation of pointdefect diffusion is hindered both by the difficulties related to direct imagingof non-periodic structures and by the time scales involved in the diffusionprocess. Here, instead of imaging thermal diffusion, we stimulate and followthe migration of a divacancy through graphene lattice using a scanningtransmission electron microscope operated at 60 kV. The beam-activated processhappens on a timescale that allows us to capture a significant part of thestructural transformations and trajectory of the defect. The low voltagecombined with ultra-high vacuum conditions ensure that the defect remainsstable over long image sequences, which allows us for the first time todirectly follow the diffusion of a point defect in a crystalline material.

Imaging Atomic-Level Random Walk of a Point Defect in Graphene