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Controlling the propagation and coupling of light to sub-wavelength antennasis a crucial prerequisite for many nanoscale optical devices. Recently, themain focus of attention has been directed towards high-refractive-indexmaterials such as silicon as an integral part of the antenna design. Thisdevelopment is motivated by the rich spectral properties of individualhigh-refractive-index nanoparticles. Here, we take advantage of theinterference of their magnetic and electric resonances, to achieve remarkablystrong lateral directionality. For controlled excitation of a spherical siliconnanoantenna we use tightly focused radially polarized light. The resultantdirectional emission depends on the antenna's position relative to the focus.This approach finds application as a novel position sensing technique, whichmight be implemented in modern nanometrology and super-resolution microscopysetups. We demonstrate in a proof-of-concept experiment, that a lateralresolution in the Angstrom regime can be achieved.

Polarization Controlled Directional Scattering for Nanoscopic Position Sensing