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Structural characterization X-ray diffraction patterns of polycrystalline powder samples were acquired by a Rigaku RINT-TTR III powder diffractometer equipped with a Cu-K radiation source (1 = 1.5405 A, 2 = 1.5443 A) operating at 50 kV and 300 mA. Typical scans were performed in the 2 range of 8~90 (step size = 0.028.s). Synchrotron X-ray diffraction (S-XRD) was conducted on the Powder Diffraction beamline at BL-10 of the Australian Synchrotron (Clayton, Australia) using radiation source of wavelength ( = 0.82550 A, calibrated against a LaB6 standard). For S-XRD, the powder samples were loaded inside glass capillaries ( = 0.3 mm) inside an Ar-filled glovebox. Rietveld analysis 1 of the SXRD data was performed using the GSAS program 2 with EXPGUI front-end 3 , taking into account the zero-shifts, scale factors, background corrections and pseudo-Voigt peak shape parameters.

Kröhnkite-Type Na2Fe(SO4)2·2H2O as a Novel 3.25 V Insertion Compound for Na-Ion Batteries

Kröhnkite-Type Na₂Fe(SO₄)₂·2H₂O as a Novel 3.25 V Insertion Compound for Na-Ion Batteries