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Semiconducting metal oxide (SMOX)-based gas sensors are indispensable forsafety and health applications, e.g. explosive, toxic gas alarms, controls forintake into car cabins and monitor for industrial processes. In the past, thesensor community has been studying polycrystalline materials as sensors wherethe porous and random microstructure of the SMOX does not allow a separation ofthe phenomena involved in the sensing process. This lead to conduction modelsthat can model and predict the behavior of the overall response, but they werenot capable of giving fundamental information regarding the basic mechanismstaking place. The study of epitaxial layers is the definite prove to clarifythe different aspects and contributions of the sensing mechanisms that are notpossible to do by studying a polycrystalline sample. A detailed analyticalmodel for n and p-type single-crystalline/compact metal oxide gas sensors wasdeveloped that directly relates the conductance of the sample with changes inthe surface electrostatic potential. Combined DC resistance and work functionmeasurements were used in a compact SnO2 (101) layer in operando conditionsthat allowed us to check the validity of our model in the region whereBoltzmann approximation holds to determine surface and bulk properties of thematerial.

Conductance Model for Single-Crystalline/Compact Metal Oxide Gas Sensing Layers in the Non-Degenerate Limit: Example of Epitaxial SnO$_2$(101)