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Point defects can have significant impacts on the mechanical, electronic andoptical properties of materials. The development of robust, multidimensional,high-throughput and large-scale characterization techniques of defects is thuscrucial, from the establishment of integrated nanophotonic technologies tomaterial growth optimization. Here, we demonstrate the potential of wide-fieldspectral single-molecule localization microscopy (spectral SMLM) for thedetermination of ensemble spectral properties, as well as characterization ofspatial, spectral and temporal dynamics of single defects in CVD-grown andirradiated exfoliated hexagonal boron-nitride (hBN) materials. We characterizethe heterogeneous spectral response of our samples, and identify at least twotypes of defects in CVD-grown materials, while irradiated exfoliated flakesshow predominantly only one type of defect. We analyze the blinking kineticsand spectral emission for each type of defects, and discuss their implicationswith respect to the observed spectral heterogeneity of our samples. Our studyshows the potential of wide-field spectral SMLM techniques in material scienceand paves the way towards quantitative multidimensional mapping of defectproperties.

Wide-field spectral super-resolution mapping of optically active defects in hBN