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The presence of non-trivial magnetic topology can give rise to non-vanishingscalar spin chirality and consequently a topological Hall or Nernst effect. Inturn, topological transport signals can serve as indicators for topologicalspin structures. This is particularly important in thin films or nanopatternedmaterials where the spin structure is not readily accessible. Conventionally,the topological response is determined by combining magnetotransport data withan independent magnetometry experiment. This approach is prone to introducemeasurement artifacts. In this study, we report the observation of largetopological Hall and Nernst effects in micropatterned thin films ofMn$_{1.8}$PtSn below the spin reorientation temperature $T_\mathrm{SR} \approx190$K. The magnitude of the topological Hall effect$\rho_\mathrm{xy}^\mathrm{T} = 8$ n$\Omega$m is close to the value reported inbulk Mn$_2$PtSn, and the topological Nernst effect $S_\mathrm{xy}^\mathrm{T} =115$ nV K$^{-1}$ measured in the same microstructure has a similar magnitude asreported for bulk MnGe ($S_\mathrm{xy}^\mathrm{T} \sim 150$ nV K$^{-1}$), theonly other material where a topological Nernst was reported. We use our data asa model system to introduce a topological quantity, which allows to detect thepresence of topological transport effects without the need for independentmagnetometry data. Our approach thus enables the study of topological transportalso in nano-patterned materials without detrimental magnetization relatedlimitations.

All Electrical Access to Topological Transport Features in Mn$_{1.8}$PtSn Films