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We developed THz-resonant scanning probe tips, yielding strongly enhanced andnanoscale confined THz near fields at their tip apex. The tips with length inthe order of the THz wavelength ({\lambda} = 96.5 {\mu}m) were fabricated byfocused ion beam (FIB) machining and attached to standard atomic forcemicroscopy (AFM) cantilevers. Measurements of the near-field intensity at thevery tip apex (25 nm radius) as a function of tip length, via graphene-based(thermoelectric) near-field detection, indicate their first and second ordergeometrical antenna resonances for tip length of 33 and 78 {\mu}m,respectively. On resonance, we find that the near-field intensity is enhancedby one order of magnitude compared to tips of 17 {\mu}m length (standard AFMtip length), which is corroborated by numerical simulations that furtherpredict remarkable intensity enhancements of about 107 relative to the incidentfield. Because of the strong field enhancement and standard AFM operation ofour tips, we envision manifold and straightforward future application inscattering-type THz near-field nanoscopy and THz photocurrent nanoimaging,nanoscale nonlinear THz imaging, or nanoscale control and manipulation ofmatter employing ultrastrong and ultrashort THz pulses.

THz nanofocusing with cantilevered THz-resonant antenna tips