English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Zendy Plus

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Zendy Tools

Zendy Open

Characterizing buried layers and interfaces is critical for a host ofapplications in nanoscience and nano-manufacturing. Here we demonstratenon-invasive, non-destructive imaging of buried interfaces using a tabletop,extreme ultraviolet (EUV), coherent diffractive imaging (CDI) nanoscope. Coppernanostructures inlaid in SiO2 are coated with 100 nm of aluminum, which isopaque to visible light and thick enough that neither optical microscopy noratomic force microscopy can image the buried interfaces. Short wavelength (29nm) high harmonic light can penetrate the aluminum layer, yieldinghigh-contrast images of the buried structures. Moreover, differences in theabsolute reflectivity of the interfaces before and after coating reveal theformation of interstitial diffusion and oxidation layers at the Al-Cu andAl-SiO2 boundaries. Finally, we show that EUV CDI provides a unique capabilityfor quantitative, chemically-specific imaging of buried structures, and thematerial evolution that occurs at these buried interfaces, compared with allother approaches.

Quantitative Chemically-Specific Coherent Diffractive Imaging of Buried Interfaces using a Tabletop EUV Nanoscope