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IR spectroscopy has been widely used for chemical identification andquantitative analysis of reactions occurring in a specific time and spacedomains by measuring an average signal of the entire system1. Achieving IRmeasurements with nanometer-scale spatial resolution is highly desirable toobtain a detailed understanding of the composition, structure and function ofinterfaces2-5. The challenges in IR nanoscopy yet exist owing to the smallmolecular cross section and pristine optical diffraction limit. Although atomicforce microscopy (AFM) based techniques, such as scattering-type scanningnear-field optical microscopy and photothermal-induced resonance microscopy(PTIR), can acquire IR spectroscopy in a few tens of nanometer scaleresolution6-9, IR measurements with monolayer level sensitivity remains elusiveand can only be realized under critical conditions10,11. Herein, we demonstratesub-10 nm spatial resolution sampling a volume of ~360 molecules with a strongfield enhancement at the sample-tip junction by implementing noble metalsubstrates (Au, Ag, Pt) in photo-induced force microscopy (PiFM). Thistechnique shows versatility and robustness of PiFM, and is promising forapplication in interfacial studies with hypersensitivity and super spatialresolution.

Tip enhanced IR imaging with sub-10 nm resolution and hypersensitivity