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The experimental limitations in the signal enhancement and spatial resolutionin spectroscopic imaging have been always a challenging task in the applicationof near-field spectroscopy for nanostructured materials in the sub-diffractionlimit. In addition, the scattering efficiency also plays an important role inimproving signal enhancement and contrast of the spectroscopic imaging ofnanostructures by scattering of light. We report the effect of scatteringefficiency in the Raman intensity enhancement, and contrast generation innear-field tip-enhanced Raman spectroscopic (TERS) imaging of one dimensionalinorganic crystalline nanostructures of Si and AlN having a large variation inpolarizability change. The Raman enhancement of pure covalently bonded Sinanowire (NW) is found to be two orders of higher in magnitude for the TERSimaging, as compared to that of AlN nanotip (NT) having a higher degree ofionic bonding, suggesting the importance of scattering efficiency of thematerials in TERS imaging. The strong contrast generation due to higher signalenhancement in TERS imaging of Si NW also helped in achieving the betterresolved spectroscopic images than that of the AlN NT. The study provides aninsight into the role of scattering efficiency in the resolution of near-fieldspectroscopic images.

Effect of Scattering Efficiency in the Tip Enhanced Raman Spectroscopic Imaging of Nanostructures in the Sub Diffraction Limit