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The recently developed information-theoretic approach to crystallographicsymmetry classifications and quantifications in two dimensions (2D) fromdigital transmission electron and scanning probe microscope images is adaptedfor the analysis of an experimental electron diffraction spot pattern, for thefirst time. Digital input data are considered in this approach to consist ofthe pixel-wise sums of approximately Gaussian distributed noise and an unknownunderlying signal that is strictly 2D periodic. Structural defects within thecrystals or on the crystal surfaces, instrumental image recording noise, slightdeviations from zero-crystal-tilt conditions in transmission electronmicroscopy, inhomogeneous staining in structural biology studies of intrinsicmembrane protein complexes in lipid bilayers, and small inaccuracies in thealgorithmic processing of the digital data all contribute to a singlegeneralized noise term. The plane symmetry group and projected Laue class(or 2DBravais lattice type) that is anchored to the least broken symmetries areidentified as genuine in the presence of generalized noise. More severelybroken symmetries that are not anchored to the least broken symmetries areidentified as pseudo-symmetries. Our point symmetry quantification study of anelectron diffraction spot pattern is highly topical because a new contrastmechanism for 4D scanning transmission electron microscopy was recentlydemonstrated by other authors. The usage of objective symmetry quantificationsis bound to become the preeminent condition of the establishment of thatcontrast mode as an industry-wide standard.

Objective Point Symmetry Classifications/Quantifications of an Electron Diffraction Spot Pattern with Pseudo-Hexagonal Metric