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Precision and accuracy of quantitative scanning transmission electronmicroscopy (STEM) methods such as ptychography, and the mapping of electric,magnetic and strain fields depend on the dose. Reasonable acquisition timerequires high beam current and the ability to quantitatively detect both largeand minute changes in signal. A new hybrid pixel array detector (PAD), thesecond-generation Electron Microscope Pixel Array Detector (EMPAD-G2),addresses this challenge by advancing the technology of a previous generationPAD, the EMPAD. The EMPAD-G2 images continuously at a frame-rates up to 10 kHzwith a dynamic range that spans from low-noise detection of single electrons toelectron beam currents exceeding 180 pA per pixel, even at electron energies of300 keV. The EMPAD-G2 enables rapid collection of high-quality STEM data thatsimultaneously contain full diffraction information from unsaturated brightfield disks to usable Kikuchi bands and higher-order Laue zones. Test resultsfrom 80 to 300 keV are presented, as are first experimental resultsdemonstrating ptychographic reconstructions, strain and polarization maps. Weintroduce a new information metric, the Maximum Usable Imaging Speed (MUIS), toidentify when a detector becomes electron-starved, saturated or its pixel countis mismatched with the beam current.

Very-High Dynamic Range, 10,000 frames/second Pixel Array Detector for Electron Microscopy