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In the scanning transmission electron microscope, fast-scanning andframe-averaging are two widely used approaches for reducing electron-beamdamage and increasing image signal-noise ratio which require no additionalspecialised hardware. Unfortunately, for scans with short pixel dwell-times(less than 5 ${\mu}$s), line flyback time represents an increasingly wastefuloverhead. Although beam exposure during flyback causes damage while yielding nouseful information, scan-coil hysteresis means that eliminating it entirelyleads to unacceptably distorted images. In this work, we reduce this flyback toan absolute minimum by calibrating and correcting for this hysteresis inpostprocessing. Substantial improvements in dose-efficiency can be realised (upto 20 %), while crystallographic and spatial fidelity is maintained fordisplacement/strain measurement.

Using Your Beam Efficiently: Reducing Electron-dose in the STEM via Flyback Compensation