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Scanning transmission electron microscopy (STEM) is an extremely versatilemethod for studying materials on the atomic scale. Many STEM experiments aresupported or validated with electron scattering simulations. However, using theconventional multislice algorithm to perform these simulations can requireextremely large calculation times, particularly for experiments with millionsof probe positions as each probe position must be simulated independently.Recently, the PRISM algorithm was developed to reduce calculation times forlarge STEM simulations. Here, we introduce a new method for STEM simulation:partitioning of the STEM probe into "beamlets," given by a natural neighborinterpolation of the parent beams. This idea is compatible with PRISMsimulations and can lead to even larger improvements in simulation time, aswell requiring significantly less computer RAM. We have performed varioussimulations to demonstrate the advantages and disadvantages of partitionedPRISM STEM simulations. We find that this new algorithm is particularly usefulfor 4D-STEM simulations of large fields of view. We also provide a referenceimplementation of the multislice, PRISM and partitioned PRISM algorithms.

A Fast Algorithm for Scanning Transmission Electron Microscopy (STEM) Imaging and 4D-STEM Diffraction Simulations