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Scanning transmission electron microscopy (STEM) is the most widespreadadopted tool for atomic scale characterization of two-dimensional (2D)materials. Many 2D materials remain susceptible to electron beam damage,despite the standardized practice to reduce the beam energy from 200 keV to 80or 60 keV. Although, all elements present can be detected by atomicelectrostatic potential imaging using integrated differential phase contrast(iDPC) STEM or electron ptychography, capturing dynamics with atomic resolutionand enhanced sensitivity has remained a challenge. Here, by using iDPC-STEM, wecapture defect dynamics in 2D WS$_2$ by atomic electrostatic potential imagingwith a beam energy of only 30 keV. The direct imaging of atomic electrostaticpotentials with high framerate reveals the presence and motion of single atomsnear defects and edges in WS$_2$ that are otherwise invisible with conventionalannular dark-field STEM or cannot be captured sufficiently fast by electronptychography.

Real-time imaging of atomic potentials in 2D materials with 30 keV electrons