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Fast pixelated detectors incorporating direct electron detection (DED)technology are increasingly being regarded as universal detectors for scanningtransmission electron microscopy (STEM), capable of imaging under multiplemodes of operation. However, several issues remain around the post acquisitionprocessing and visualisation of the often very large multidimensional STEMdatasets produced by them. We discuss these issues and present open sourcesoftware libraries to enable efficient processing and visualisation of suchdatasets. Throughout, we provide examples of the analysis methodologiespresented, utilising data from a 256$\times$256 pixel Medipix3 hybrid DEDdetector, with a particular focus on the STEM characterisation of thestructural properties of materials. These include the techniques of virtualdetector imaging; higher order Laue zone analysis; nanobeam electrondiffraction; and scanning precession electron diffraction. In the latter, wedemonstrate nanoscale lattice parameter mapping with a fractional precision$\le 6\times10^{-4}$ (0.06%).

microscopy and microanalysis

Fast Pixelated Detectors in Scanning Transmission Electron Microscopy.  Part II: Post Acquisition Data Processing, Visualisation, and Structural  Characterisation