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We have grown intermetallic ErPd$_2$Si$_2$ single crystals employinglaser-diodes with the floating-zone method. The temperature-dependentcrystallography was determined using synchrotron and in-house X-ray powderdiffraction measurements from 20 to 500 K. The diffraction patterns fit wellwith the tetragonal $I$4/$mmm$ space group (No. 139) with two chemical formulaswithin one unit cell. Our synchrotron X-ray powder diffraction study shows thatthe refined lattice constants are $a$ = 4.10320(2) {\AA}, $c$ = 9.88393(5){\AA} at 298 K and $a$ = 4.11737(2) {\AA}, $c$ = 9.88143(5) {\AA} at 500 K,resulting in the unit-cell volume $V$ = 166.408(1) {\AA}$^3$ (298 K) and167.517(2) {\AA}$^3$ (500 K). In the whole studied temperature range, we didnot find any structural phase transition. Upon cooling, the lattice constants aand c are shortened and elongated, respectively.

Temperature-dependent structure of an intermetallic ErPd$_2$Si$_2$ single crystal: A combined synchrotron and in-house X-ray diffraction study