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Representative compounds of the new family of magnetic materials Gd5-xNdxSi4were analyzed by X-ray diffraction at the XRD1 beamline at LNLS. To reduceX-ray absorption, thin layers of the powder samples were mounted outside thecapillaries and measured in Debye-Scherrer geometry as usual. The X-raydiffraction analyses and the magnetometry results indicate that the behavior ofthe magnetic transition temperature as a function of Nd content may be directlyrelated to the average of the four smallest interatomic distances betweendifferent rare earth sites of the majority phase of each compound. The qualityand consistency of the results show that the XRD1 beamline is able to performsatisfactory X-ray diffraction experiments on high-absorption materials evenoff the best conditions.

X-ray powder diffraction of high-absorption materials at the XRD1 beamline off the best conditions: Application to (Gd,Nd)5Si4 compounds