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Diffraction pattern analysis can be used to reveal the crystalline structureof materials, and this information is used to nano- and micro-structure ofadvanced engineering materials that enable modern life. For nano-structuredmaterials typically diffraction pattern analysis is performed in thetransmission electron microscope (TEM) and TEM diffraction patterns typicallyhave a limited angular range (less than a few degrees) due to the long cameralength, and this requires analysis of multiple patterns to probe a unit cell.As a different approach, wide angle Kikuchi patterns can be captured using anon-axis detector in the scanning electron microscope (SEM) with a shortercamera length. These 'transmission Kikuchi diffraction' (TKD) patterns presenta direct projection of the unit cell and can be routinely analyzed usingEBSD-based methods and dynamical diffraction theory. In the present work, weenhance this analysis significantly and present a multi-exposure diffractionpattern fusion method that increases the dynamic range of the detected patternscaptured with a Timepix3-based direct electron detector (DED). This method usesan easy-to-apply exposure fusion routine to collect data and extend the dynamicrange, as well as normalize the intensity distribution within these very wide(>95{\deg}) angle patterns. The potential of this method is demonstrated withfull diffraction sphere reprojection and highlight potential of the approach torapidly probe the structure of nano-structured materials in the scanningelectron microscope.

Multi-exposure diffraction pattern fusion applied to enable wider-angle transmission Kikuchi diffraction with direct electron detectors