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Recently, Lorentz transmission electron microscopy (LTEM) has helpedresearchers advance the emerging field of magnetic skyrmions. These magneticquasi-particles, composed of topologically non-trivial magnetization textures,have a large potential for application as information carriers in low-powermemory and logic devices. LTEM is one of a very few techniques for direct realspace imaging of magnetic features at the nanoscale. For Fresnel-contrast LTEM,the transport of intensity equation (TIE) is the tool of choice forquantitative reconstruction of the local magnetic induction through the samplethickness. Typically this analysis requires collection of at least threeimages.Here we show that for uniform thin magnetic films which includes manyskyrmionic samples, the magnetic induction can be quantitatively determinedfrom a single defocused image using a simplified TIE approach.

A streamlined approach to mapping the magnetic induction of skyrmionic materials