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An in situ tip preparation procedure compatible with ultra-low temperatureand high magnetic field scanning tunneling microscopes is presented. Thisprocedure does not require additional preparation techniques such as thermalannealing or ion milling. It relies on the local electric-field-induceddeposition of material from the tip onto the studied surface. Subsequently,repeated indentations are performed onto the sputtered cluster to mechanicallyanneal the tip apex and thus to ensure the stability of the tip. The efficiencyof this method is confirmed by comparing the topography and spectroscopy dataacquired with either unprepared or in situ prepared tips on epitaxial graphenegrown on Ru (0001). We demonstrate that the use of in situ prepared tipsincreases the stability of the scanning tunneling images and thereproducibility of the spectroscopic measurements.

Highly reproducible low temperature scanning tunnelling microscopy and spectroscopy with in situ prepared tips