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We have studied the dynamics of quartz tuning fork resonators used in atomicforce microscopy taking into account mechanical energy dissipation through theattachment of the tuning fork base. We find that the tuning fork resonatorquality factor changes even for the case of a purely elastic sensor-sampleinteraction. This is due to the effective mechanical imbalance of the tuningfork prongs induced by the sensor-sample force gradient which in turn has animpact on the dissipation through the attachment of the resonator base. Thiseffect may yield a measured dissipation signal that can be different to the oneexclusively related to the dissipation between the sensor and the sample. Wealso find that there is a second order term in addition to the linearrelationship between the sensor-sample force gradient and the resonancefrequency shift of the tuning fork that is significant even for force gradientsusually present in atomic force microscopy which are in the range of tens ofN/m.

Force-gradient-induced mechanical dissipation of quartz tuning fork force sensors used in atomic force microscopy