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We investigate the growth of thin Fe layers on MgAl$_2$O$_4$~(001) andMgO~(001) substrates using dc magnetron sputtering. The crystal quality of Felayers deposited on MgAl$_2$O$_4$ is found to be substantially higher ascompared to Fe grown on MgO substrates. The effects of the crystal quality onthe magnetic and electronic transport properties are discussed.

Influence of misfit strain on the physical properties of Fe thin films