English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Zendy Open

Presents the pdf analysis as premium feature

PDF Analysis

Insights

Presents the summarisation as premium feature

Summarisation

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the zaia usage as premium feature

ZAIA

Zendy Tools

Zendy Plus

Presents the access of premium content as premium feature

Premium Content

When the thickness of the layer is smaller than the electrons mean free path,the morphology affects the conductivity directly based on the layer thickness.This issue provides basis in order to estimate the thickness of the layer byunderstanding the morphology and the value of the conductivity. This method isan inverse approach on thickness estimation and is applied to various samples.The comparison of the results with other thickness estimations shows goodconsistency. The benefits of this approach is that the only parameter thatneeds to be measured is the conductivity, which is quite trivial. Despite thesimplicity of this approach, its results would prove adequate to study both thematerial properties and the morphology of the layer. In addition, thepossibility of repeating the measurements on thickness for AC currents withvarious frequencies enables averaging the measurements in order to obtain themost precise results.

Thin films thickness Measurement by the conductivity theory in the framework of born approximation