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In this work recently produced and commercially available glazed ceramicobject with metallic lustre decoration was studied by using a spectroscopicellipsometer with rotating compensator. The thickness and metal content of thesurface lustre layers are determined by ion beam analytical techniques, i.e.,Rutherford backscattering spectrometry and external beam particle-induced X-rayemission and the results were utilized in the construction of multilayeroptical models for the evaluation and interpretation of thespectroellipsometric measurements.

Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration