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Graded composition CdxZn1-xTe films were prepared by growing severalalternate layers of CdTe and ZnTe by the Isothermal Close Space Sublimationtechnique. The thickness of both kinds of layers was modified along thestructure to produce an increase of the average concentration of CdTe towardsthe surface of the films. Due to Zn/Cd inter-diffusion during the growthprocess the sequence of layers was converted into a relatively smooth gradedcomposition film. According to X- ray diffraction characterization the layersgrew coherently with the (100) oriented GaAs substrates although they showed arelatively high mosaicity. Theta-2theta plots show very wide diffraction peaksas expected from variable composition samples. The band gap grading effect inlight absorption was also verified through transmission measurements, usingtransparent substrates. Graded composition profiles of the thin films wereconfirmed by x-ray photoelectron and secondary ion mass spectroscopies.Moreover, quantitative Cd, Zn and Te profiles were obtained by the analysis ofRutherford backscattering spectra of the samples. This analysis showed a CdTemolar fraction profile ranging from approximately x = 0.8 at the surface of thesample and x = 0.35 at the interface with the substrate. The possibility ofgrowing graded composition layers using a simple and cost-effective procedurewas demonstrated. This could be interesting in technological applications likeCdxZn1-xTe layers of variable composition in CdS/CdTe solar cells

Graded composition Cd$_x$Zn$_{1-x}$Te films grown by Isothermal Close Space Sublimation technique