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The empirical Coffin-Manson law has been used to characterize the low-cyclemechanical fatigue failure of metallic materials for decades. Our experimentalstudies reported in this letter have shown that the electrical fatigue failurein dielectrics can be well described by a fitting function having the samemathematical expression as that of the Coffin-Manson law. This observationindicates that the physical mechanism beneath the formation and evolution ofatomic disordered structures, the key factor influencing both mechanical andelectrical fatigue, might be the same.

Experimental evidence that electrical fatigue failure obeys a generalized Coffin-Manson law