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Local surface conductivity properties and surface degradation of c-axisoriented YBa2Cu3O6+x (YBCO) thin films were studied by Scanning SpreadingResistance Microscopy (SSRM). For the surface degradation studies, the YBCOsurface was cleaned by ion beam etching and the SSRM surface conductivity maphas been subsequently repeatedly measured over several hours in air and purenitrogen. Average surface conductivity of the scanned area was graduallydecreasing over time in both cases, faster in air. This was explained by oxygenout-diffusion in both cases and chemical reactions with water vapor in air. Theobtained surface conductivity images also revealed its high inhomogenity onmicrometer and nanometer scale with numerous regions of highly enhancedconductivity compared to the surroundings. Furthermore, it has been shown thatthe size of these conductive regions considerably depends on the appliedvoltage. We propose that such inhomogeneous surface conductivity is most likelycaused by varying thickness of degraded YBCO surface layer as well as varyingoxygen concentration (x parameter) within this layer, what was confirmed byscanning Auger electron microscopy (SAM). In our opinion the presented findingsmight be important for analysis of current-voltage and differentialcharacteristics measured on classical planar junctions on YBCO as well as otherperovskites.

Studies of YBa2Cu3O6+x degradation and surface conductivity properties by Scanning Spreading Resistance Microscopy