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Recently it has been shown that the modules and phase of complex reflectioncoefficient can be determined by using a magnetic substrate and polarizedneutrons. Several other methods have also been worked out based on measurementof polarizations of reflected neutrons from magnetic reference layers andmagnetic substrate. However, due to the fact that available reflectometers arelimited in the choice of polarization of reflected beam in the same directionas the polarization of the incident beam, neither of the methods which arebased on polarization analysis, has been proven to be experimentally practical.In this paper, we have proposed a new method for determining the phase ofreflection coefficient which is based on two measurements of polarization whichcorrespond to two magnetic fields with the same magnitudes and differentorientations. The polarization analysis is performed in the same direction asthe polarization of the incident beam and is well suited for availablereflectometers. The problems envisaged in implementation of the method are alsodiscussed.

Retrieval of depth profile of nano scale thin films by one directional polarization analysis in neutron specular reflectometry