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Flicker (1/f^gamma) voltage noise spectrum is derived from finite-temperaturequantum electromagnetic fluctuations produced by elementary charge carriers inexternal electric field. It is suggested that deviations of the frequencyexponent \gamma from unity, observed in thin metal films, can be attributed toquantum backreaction of the conducting medium on the fluctuating field of thecharge carrier. This backreaction is described phenomenologically in terms ofthe effective momentum space dimensionality, D. Using the dimensionalcontinuation technique, it is shown that the combined action of the photon heatbath and external field results in a 1/f^gamma-contribution to the spectraldensity of the two-point correlation function of electromagnetic field. Thefrequency exponent is found to be equal to 1 + delta, where delta = 3 - D is areduction of the momentum space dimensionality. This result is applied to thecase of a biased conducting sample, and a general expression for the voltagepower spectrum is obtained which possesses all characteristic properties ofobserved flicker noise spectra. The range of validity of this expression coverswell the whole measured frequency band. Gauge independence of the powerspectrum is proved. It is shown that the obtained results naturally resolve theproblem of divergence of the total noise power. A detailed comparison with theexperimental data on flicker noise measurements in metal films is given.

Quantum Theory of Flicker Noise in Metal Films