English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Zendy Plus

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Zendy Tools

Zendy Open

There are several methods to focus light behind a scattering medium, but veryfew use fluorescence light as feedback or can be used without access to thedistal side of the scatterer. Among all the wave-front shaping techniques,retrieving the transmission matrix of a scattering material is the only onethat allows for focusing on multiple spots after a single set of measurements.Here we propose a method to retrieve the transmission matrix of a scattererusing fluorescence light as feedback without access to the distal side. Theadvantage of this method is that it allows focusing on the whole field of viewafter a single matrix measurement without affecting the sample, making itsuitable for reflection epi-illumination geometry microscopy.

Measuring the Transmission Matrix of a scattering medium using Epi-Fluorescence light