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Parametric X-ray radiation (PXR) from relativistic electrons moving in acrystal along the crystal-vacuum interface is considered. In this geometry theemission of photons is happening in the regime of extremely asymmetricdiffraction (EAD). In the EAD case the whole crystal length contributes to theformation of X-ray radiation opposed to Laue and Bragg geometries, where theemission intensity is defined by the X-ray absorption length. We demonstratethat this phenomenon should be described within the dynamical theory ofdiffraction and predict a radical increase of the PXR intensity. In particular,under realistic electron-beam parameters, an increase of two orders ofmagnitude in PXR-EAD intensity can be obtained in comparison with conventionalexperimental geometries of PXR. In addition we discuss in details theexperimental feasibility of the detection of PXR-EAD.

Radical increase of the parametric X-ray intensity under condition of extremely asymmetric diffraction