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X-ray production differential cross sections induced by C and Si ions withenergies from 1 MeV/u down to 0.25 MeV/u, produced by the CMAM 5 MV tandemaccelerator, have been measured for thin targets of Ti, Fe, Zn, Nb, Ru and Tain a direct way. X-rays have been detected by a fully characterized silicondrift diode and beam currents have been measured by a system of two Faradaycups. Measured cross sections agree in general with previously publishedresults. The ECPSSR theory with the united atoms correction gives absolutevalues close to the experimental ones for all the studied elements excited by Cions and for Ta, Nb and Ru excited by Si ions. For Ti, Fe and Zn excited by Si,the basic ECPSSR theory gives better agreement, although on absolute values thegap for Ti is still large.

Cross sections of X-ray production induced by C and Si ions with energies up to 1 MeV/u on Ti, Fe, Zn, Nb, Ru and Ta