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The Kossel interferences generated by characteristic x-ray lines producedinside a periodic multilayer have been observed upon proton irradiation, bysubmitting a Cr/B4C/Sc multilayer stack to 2 MeV protons and observing theintensity of the Sc and Cr K$\alpha$ characteristic emissions as a function ofthe detection angle. When this angle is close to the Bragg angle correspondingto the emission wavelength and period of the multilayer, an oscillation of themeasured intensity is detected. The results are in good agreement with a modelbased on the reciprocity theorem. The combination of the Kossel measurementsand their simulation, will be a useful tool to obtain a good description of themultilayer stack and thus to study nanometer-thick layers and their interfaces.

Kossel interferences of proton-induced X-ray emission lines in periodic multilayers