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In this paper we show how single layer graphene can be utilized to studyswift heavy ion (SHI) modifications on various substrates. The samples wereprepared by mechanical exfoliation of bulk graphite onto SrTiO$_3$, NaCl andSi(111), respectively. SHI irradiations were performed under glancing angles ofincidence and the samples were analysed by means of atomic force microscopy inambient conditions. We show that graphene can be used to check whether theirradiation was successful or not, to determine the nominal ion fluence and tolocally mark SHI impacts. In case of samples prepared in situ, graphene isshown to be able to catch material which would otherwise escape from thesurface.

Detecting swift heavy ion irradiation effects with graphene