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We present experimental studies on the charge transfer inefficiency (CTI) ofcharge-coupled device (CCD) developed for the soft X-ray imaging telescope,Xtend, aboard the XRISM satellite. The CCD is equipped with a charge injection(CI) capability, in which sacrificial charge is periodically injected to fillthe charge traps. By evaluating the re-emission of the trapped charge observedbehind the CI rows, we find that there are at least three trap populations withdifferent time constants. The traps with the shortest time constant, which isequivalent to a transfer time of approximately one pixel, are mainlyresponsible for the trailing charge of an X-ray event seen in the followingpixel. A comparison of the trailing charge in two clocking modes reveals thatthe CTI depends not only on the transfer time but also on the area, namely theimaging or storage area. We construct a new CTI model with taking into accountwith both transfer-time and area dependence. This model reproduces the dataobtained in both clocking modes consistently. We also examine apparent fluxdependence of the CTI observed without the CI technique. The higher incidentX-ray flux is, the lower the CTI value becomes. It is due to a sacrificialcharge effect by another X-ray photon. This effect is found to be negligiblewhen the CI technique is used.

Experimental studies on the charge transfer inefficiency of CCD developed for the soft X-ray imaging telescope Xtend aboard the XRISM satellite