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Recently, the Istituto Nazionale di Astrofisica (INAF) has placed a contractwith Hamamatsu Photonics to acquire hundreds of Silicon Photomultipliers (SiPM)tiles to build 10 cameras with 37 tiles each for the ASTRI Mini-Array (MA)project. Each tile is made up of 8x8 pixels of 7x7 mm2 with micro-cells of75um. To check the quality of the delivered tiles a complex and acurate testplan has been studied. The possibility to simultaneously analyse as many pixelsas possible becomes of crucial im-portance. Dark Count Rate (DCR) versusover-voltage and versus temperature and Optical Cross Talk (OCT) versusover-voltage can be easily measured simultaneously for all pixels because theyare carried out in dark conditions. On the contrary, simultaneous PhotonDetection Efficiency (PDE) measurement of all pixels of a tile is not easilyachievable and needs an appropriate optical set-up. Simultaneous measurementshave the advantage of speeding up the entire procedure and enabling quick PDEcompari-son of all the tile pixels. The paper describes the preliminary stepsto guarantee an accurate absolute PDE measurement and the investigation thecapa-bility of the electronics to obtain simultaneous PDE measurements. It alsodemonstrates the possibility of using a calibrated SiPM as reference detectorinstead of a calibrated photodiode. The method to achieve accurate absolute PDEof four central pixels of a tile is also described.

Characterization method to achieve simultaneous absolute PDE measurements of all pixels of an ASTRI Mini-Array camera tile