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Silicon Drift Detectors, widely employed in high-resolution and high-rateX-ray applications, are considered here with interest also for electrondetection. The accurate measurement of the tritium beta decay is the core ofthe TRISTAN (TRitium Investigation on STerile to Active Neutrino mixing)project. This work presents the characterization of a single-pixel SDD detectorwith a mono-energetic electron beam obtained from a Scanning ElectronMicroscope. The suitability of the SDD to detect electrons, in the energy rangespanning from few keV to tens of keV, is demonstrated. Experimentalmeasurements reveal a strong effect of the detector's entrance window structureon the observed energy response. A detailed detector model is thereforenecessary to reconstruct the spectrum of an unknown beta-decay source.

Characterization of a Silicon Drift Detector for High-Resolution Electron Spectroscopy