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A CdTe double-sided strip detector (CdTe-DSD) is an ideal device for imagingand spectroscopic measure- ments in the hard X-ray range above 10 keV. Recentdevelopment enables us to realize an imager with a detection area of ~10cm${^2}$. An energy resolution of 1-2 keV (FWHM) and a position resolution of afew hundred {\mu}m are available from the detector. This type of imager hasbeen long awaited for non-destructive elemental analysis, especially by usingnegative muons, because energies of characteristic X-rays from muonic atoms areabout 200 time higher than those from normal atoms. With the method that usesnegative muons, hard X-ray information gives the spatial distribution ofelements in samples at a certain depth defined by the initial momentum of themuon beam. In order to study three-dimensional imaging capability of themethod, we have developed a compact imaging system based on CdTe-DSD and a{\phi}3 mm pinhole collimator as the first prototype. We conducted experimentswith samples which consist of layers of Al, BN and LiF irradiated by negativemuon beams in MUSE/J-PARC and successfully reconstruct hard X-ray images ofmuonic X-rays from B, N and F at various depths.

A compact imaging system with a CdTe double-sided strip detector for non-destructive analysis using negative muonic X-rays