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Many rare event searches including dark matter direct detection andneutrinoless double beta decay experiments take advantage of the high VUVreflective surfaces made from polytetrafluoroethylene (PTFE) reflectormaterials to achieve high light collection efficiency in their detectors. Asthe detectors have grown in size over the past decade, there has also been anincreased need for ever thinner detector walls without significant loss inreflectance to reduce dead volumes around active noble liquids, outgassing, andpotential backgrounds. We report on the experimental results to measure thedependence of the reflectance on thickness of two PTFE samples at wavelengthsnear 178 nm. No change in reflectance was observed as the thickness of acylindrically shaped PTFE vessel immersed in liquid xenon was varied between 1mm and 9.5 mm.

Reflectance dependence of polytetrafluoroethylene on thickness for xenon scintillation light