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We have developed a position response calibration method for a micro-channelplate (MCP) detector with a delay-line anode position readout scheme. Using an{\em in situ} calibration mask, an accuracy of 8~$\mu$m and a resolution of85~$\mu$m (FWHM) have been achieved for MeV-scale $\alpha$ particles and ionswith energies of $\sim$10~keV. At this level of accuracy, the differencebetween the MCP position responses to high-energy $\alpha$ particles andlow-energy ions is significant. The improved performance of the MCP detectorcan find applications in many fields of AMO and nuclear physics. In our case,it helps reducing systematic uncertainties in a high-precision nuclear$\beta$-decay experiment.

High accuracy position response calibration method for a micro-channel plate ion detector