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The dynamics of photo-excited charge carriers, particularly their transportand interactions with defects and interfaces, play an essential role indetermining the performance of a wide range of solar and optoelectronicdevices. A thorough understanding of these processes requires tracking themotion of photocarriers in both space and time simultaneously with extremelyhigh resolutions, which poses a significant challenge for previously developedtechniques, mostly based on ultrafast optical spectroscopy. Scanning ultrafastelectron microscopy (SUEM) is a recently developed photon-pump-electron-probetechnique that combines the spatial resolution of scanning electron microscopes(SEM) and the temporal resolution of femtosecond ultrafast lasers. Despite manyrecent excellent reviews for the ultrafast electron microscopy, we dedicatethis article specifically to SUEM, where we review the working principle andcontrast mechanisms of SUEM in the secondary-electron-detection mode from ausers' perspective and discuss the applications of SUEM to directly imagephotocarrier dynamics in various materials. Furthermore, we propose futuretheoretical and experimental directions for better understanding and fullyutilizing the SUEM measurements to obtain detailed information about thedynamics of photocarriers. To conclude, we envision the potential of expandingSUEM into a versatile platform for probing photophysical processes beyondphotocarrier dynamics.

Scanning Ultrafast Electron Microscopy: A Novel Technique to Probe Photocarrier Dynamics with High Spatial and Temporal Resolutions