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We have implemented three different optical methods to quantitatively assessthe thickness of thin GaSe flakes transferred on both transparent substrates,like Gel-Film, or SiO2/Si substrates. We show how their apparent color can bean efficient way to make a quick rough estimation of the thickness of theflakes. This method is more effective for SiO2/Si substrates as the thicknessdependent color change is more pronounced on these substrates than ontransparent substrates. On the other hand, for transparent substrates, thetransmittance of the flakes in the blue region of the visible spectrum can beused to estimate the thickness. We find that the transmittance of flakes in theblue part of the spectrum decreases at a rate of 1.2%/nm. On SiO2/Si, thethickness of the flakes can be accurately determined by fitting opticalcontrast spectra to a Fresnel law-based model. Finally, we also show how thequantitative analysis of transmission mode optical microscopy images can be apowerful method to quickly probe the environmental degradation of GaSe flakesexposed to aging conditions.

Optical microscopy-based thickness estimation in thin GaSe flakes