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To engineer the next generation of advanced materials we must understandtheir microstructure, and this requires microstructural characterization. Thiscan be achieved through the collection of high contrast, data rich, andinsightful microstructural maps. Electron backscatter diffraction (EBSD) hasemerged as a popular tool available within the scanning electron microscope(SEM), where maps are realized through the repeat capture and analysis ofKikuchi diffraction patterns. Typical commercial EBSD systems require large andsophisticated detectors that are mounted on the side of the SEM vacuum chamberwhich can be limiting in terms of widespread access to the technique. In thiswork, we present an alternative open-hardware solution based upon a compactEBSD system with a simple, static geometry that uses an off-the-shelf directelectron detector co-mounted with a sample. This simple stage is easy tomanufacture and improves our knowledge of the diffraction geometrysignificantly. Microscope and detector control is achieved through softwareapplication programming interface (API) integration. After pattern capture,analysis of the diffraction patterns is performed using open-source analysiswithin AstroEBSD. To demonstrate the potential of this set up, we present twosimple EBSD experiments using line scan and mapping. We hope that the presentsystem can inspire simpler EBSD system design for widespread access to the EBSDtechnique and promote the use of open-source software and hardware in theworkflow of EBSD experiments.

A simple, static and stage mounted direct electron detector based electron backscatter diffraction system