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In this paper, we introduce a novel artificial neural network (ANN) basedscheme to estimate the thickness of thin films deposited on a given substrate.Here we consider the visible interference pattern between a plane wave and adiverging wave reflected from the thin film surface that records the thicknessinformation of the thin film. We assume a uniform thickness profile of thefilm. However, the thickness increases as the deposition takes place. Weextract the intensity data along a line through the center of the interferencepattern. We train our network by using a number of such line information ofknown thickness profiles. The performance of the trained network is then testedby estimating the thickness of unknown surfaces. The numerical simulationresults show that the proposed technique can be very much useful for automatedmeasurement of thickness, quickly and in real time, during deposition

Application of artificial neural network to determine the thickness profile of thin film